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| Reply To: | TechNet E-Mail Forum. |
| Date: | Thu, 26 Jun 2003 08:23:56 -0500 |
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We measure CP and CPK on all reflow ovens, wash temperatures, test performance metrics, and ionic contamination. We perform yield data analysis by work order by month, from this information we calculate rolled through process yield. We also use this information for triggering reduced or increased inspection sample size changes on continuous running lines.
I would think your job of implementation is easier then most. High runners and low mix is optimal. We have low and high runners, high mix, and unforecastable build schedules across our customer base.
Kat
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<DIV><FONT size=1>We measure CP and CPK on all reflow ovens, wash temperatures,
test performance metrics, and ionic contamination. We perform yield data
analysis by work order by month, from this information we calculate rolled
through process yield. We also use this information for triggering
reduced or increased inspection sample size changes on continuous
running lines. </FONT></DIV>
<DIV><FONT size=1></FONT> </DIV>
<DIV><FONT size=1>I would think your job of implementation is easier then
most. High runners and low mix is optimal. We have low and high
runners, high mix, and unforecastable build schedules across our customer
base. </FONT></DIV>
<DIV><FONT size=1></FONT> </DIV>
<DIV><FONT size=1>Kat</FONT></DIV></BODY></HTML>
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Please visit IPC web site http://www.ipc.org/html/forum.htm for additional
information, or contact Keach Sasamori at [log in to unmask] or 847-509-9700 ext.5315
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