TECHNET Archives

May 2003

TechNet@IPC.ORG

Options: Use Monospaced Font
Show Text Part by Default
Show All Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Subject:
From:
Werner Engelmaier <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Tue, 20 May 2003 15:47:04 EDT
Content-Type:
text/plain
Parts/Attachments:
text/plain (28 lines)
Hi Ofer,
That could be true for PCBs subjected to HASL; for non-HASL'ed PCBs there is
no loading condition that should produce barrel cracks or inner-layer
separation. I would be interested to hear, if your experience is contrary to this.

Regards,
Werner Engelmaier

In a message dated 05/20/2003 9:42:00, [log in to unmask]
writes:
>Since the PCB manufacturers (at least, those we are purchasing from...) are
>inspecting the discrete layers with AOI, and (seldom) also checking them
>electrically, then the major reason for failures during the final electrical
>testing is via opens. This rate is a function of the aspect ratio, and
>heavily depends on the manufacturer's process capability. The failure rate
>may well pass the 20% in complex card.

---------------------------------------------------
Technet Mail List provided as a free service by IPC using LISTSERV 1.8e
To unsubscribe, send a message to [log in to unmask] with following text in
the BODY (NOT the subject field): SIGNOFF Technet
To temporarily halt or (re-start) delivery of Technet send e-mail to [log in to unmask]: SET Technet NOMAIL or (MAIL)
To receive ONE mailing per day of all the posts: send e-mail to [log in to unmask]: SET Technet Digest
Search the archives of previous posts at: http://listserv.ipc.org/archives
Please visit IPC web site http://www.ipc.org/html/forum.htm for additional
information, or contact Keach Sasamori at [log in to unmask] or 847-509-9700 ext.5315
-----------------------------------------------------

ATOM RSS1 RSS2