Colleagues,

 

Attached is the agenda for the D-37D Embedded Test Methods Task Group meeting being held on Monday, November 4 from 3:15 pm - 5:00 pm in the Magnolia Room at the Hyatt Regency as part of the IPC Annual Meeting 2002.

 

Please notice that the meeting time has changed from the original 10:15 am - 12:00 pm slot to the current 3:15 pm - 5:00 pm slot.  

 

Regards,

 

John Perry





 





 





EMBEDDED PASSIVE DEVICES TEST METHODS  D37d 

 Monday, November 4 2002





10:30 – 12:00 





 



 





Agenda





 



3:15             Welcome                                                                                J. Obrzut



 



3:25   Minutes from the RTC meeting on 07/31/02                                  J. Obrzut



            



 



3:45         Dielectric withstanding voltage          

Review of the draft test method. 

       test procedure for measurements in z and x-y directions

.       test conditions



                  Referenced are:       ASTM D149-97A, IPC TM650 – 2.5.6.1 and 2.5.7.1



 



4:00      Dielectric withstanding voltage: Application Note         J. Obrzut

 Practical example of an experimental set-up and results



                        test vehicle 



                        circuit analysis 



                        instrumentation 



                        data acquisition (voltage waves instead of point by point analysis)



                        calculations for complex impedance (amplitude and phase)



 





                  Example results obtained for embedded passive capacitance materials





                        FR4 laminate materials (4 mil and 2 mil thick)



                              High-k materials with ceramic filler



                                          epoxy base – 4 mil thick



                                          epoxy base – ½ mil thick



                                          polyimide base 2 mil thick



 



                  Discussion / Comments o                                                            All

 



 



 



4:40         Testing nominal values of R, C, and L          All



                  discussing the constant current test vs frequency domain testing 



                        



4:50         Up-date on High Frequency Dielectric Test Fixture                  J. Obrzut



 



4: 55             Summarize day and confirm action items               J. Obrzut



 



5:00 pm             Adjourn