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September 2002

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Date:
Fri, 6 Sep 2002 23:03:56 EDT
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"TechNet E-Mail Forum." <[log in to unmask]>, [log in to unmask]
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From:
Werner Engelmaier <[log in to unmask]>
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Hi Earl,
I can send you lots of pictures of ILS. It occurs on the larger diameter PTHs
of normal MLBs near the surface [layers 2, 3, N-1, N-2]. Higher failure
propabilities: more resin content, higher T-excursions, more imbalance
between barrel wall thickness and inner-layer foil thickness, thicker
core/prepreg layers.
Take a look at IPC-TR-486, Report On Round Robin Study To Correlate
Interconnect Stress Test (IST) With Thermal Stress/Microsectioning
Evaluations For Detecting The Presence Of Inner-Layer Separations.

Werner

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