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July 2002

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Subject:
From:
Earl Moon <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Wed, 17 Jul 2002 11:03:37 -0500
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Look at your favorite IPC-2221 and it explains only the DFT aspect but
shows clearly where to probe and why. I'm going through the same thing
now with my client and I have devised a strategey using boundary scan,
for those devices and circuits capable of this testing, and ICT probing.
The number of test points has been reduced by half on one board using
boundary scan in conjunction with probing. It's not exactly what you
wanted to hear but you might convince the customer it needs some testing
as fault/defect findings.

MoonMan

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