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July 2002

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Subject:
From:
Earl Moon <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Tue, 2 Jul 2002 11:30:39 -0500
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Thanks Peter,

All points well taken. I am only going to use boundary scan with traditional
physical in-circuit test methods. On one of my boards, this strategy will
reduce physical test points by about half ensuring test points on grid, etc.

I'll keep you informed as I venture into R/F testing and functional testing
as well on some boards. This should complete my DFM education for the month
ahead. Sure looking forward to becoming a real DFM/CE kinda guy, or not. The
company, and its team members are sure improving though.

Earl

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