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June 2002

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Subject:
From:
Eric Christison <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Fri, 7 Jun 2002 11:02:43 +0100
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Dear Readers,

I have to measure the variation in position between a fiducial on the
top surface of a substrate and a pad pattern on the bottom surface. I
don't have any inspection equipment that can view both surfaces
simultaneously and am dissatisfied with our current method of
measurement.

can anyone direct me to a UK facility that may be able to carry out such
a measurement for me?

Thanks,

--
Eric Christison
Mechanical Engineer
STMicroelectronics
33 Pinkhill
Edinburgh
EH12 7BF

tel:    +44 (0)131 336 6165
fax:    +44 (0)131 336 6001

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