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Subject:	Re: Is X-RAY can damaged Flash IC i.e. imbeded program ?
From:	David Hillman <[log in to unmask]>
Reply To:	TechNet E-Mail Forum.
Date:	Wed, 21 Nov 2001 08:50:22 -0600
Content-Type:	text/plain
Parts/Attachments:	text/plain (57 lines)

Hi Mario! I have a reference which may be helpful. A number of years ago
Nicolet Instruments (they are an xray equipment supplier) worked with
Sandia National Labs on the effects of ionizing radiation on electronic
components. They used a 100KV anode voltage and exposed a variety of
components to ionizing radiation for various dwell times. Their conclusion
was that it would require 43 days of direct exposure to damage a component
(for the testing conditions and specific components selected). Contact
Nicolet Test Instruments Division and obtain a copy of their Application
Notes titled "Ionizing Radiation and Its Effects Upon Electronic
Components" for the details. Good Luck.

Dave Hillman
Rockwell Collins
[log in to unmask]





Mario Dion <[log in to unmask]>@ipc.org> on 11/19/2001 09:21:47 AM

Please respond to "TechNet E-Mail Forum." <[log in to unmask]>

Sent by:  TechNet <[log in to unmask]>


To:   [log in to unmask]
cc:

Subject:  [TN] Is X-RAY can damaged Flash IC i.e. imbeded program ?


Bonjour,

Is there any study done about the effects of X-RAYs (INCLUDING
Airports/Customs systems) on electronic assembly ??

We have had few problems with products recently where the programmed flash
was not functionnal (corrupted data) when tested at customer site (foreign
countries). The flash used is from 29F016 family. We are wandering about
the multiple X-RAY inspection the products is submitted through during
transportation.

Thanks for your help,

Mario

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