TECHNET Archives

June 2001

TechNet@IPC.ORG

Options: Use Monospaced Font
Show Text Part by Default
Show All Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Subject:
From:
Steve Joy <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Tue, 5 Jun 2001 09:09:53 -0700
Content-Type:
text/plain
Parts/Attachments:
text/plain (30 lines)
I am a little confused about BGA voids and reliability.

How many field returns per year do we collectively see? My experience over
the last several years was 0. Don't recall ever seeing one.  But we all
build to specs that mathematically predict some defects. So where are they?

So it  must meaqn the spec requirements are excessively tight. The
characteristic life curves I developed showed that assemblies are
incredibly robust.  Of course, that is using the accepted acceleration
factors.

Which is my point. Why can't we use realistic (or better-experimentally
defined) limits? I  have run assemblies beyond 1K cycles (of -45C to 85C)
with 70% voids and seen no failures. I am talking millions of joints in
many package styles.

Is there any industry group looking at this kind of problem?

Steve

---------------------------------------------------------------------------------
Technet Mail List provided as a free service by IPC using LISTSERV 1.8d
To unsubscribe, send a message to [log in to unmask] with following text in
the BODY (NOT the subject field): SIGNOFF Technet
To temporarily halt delivery of Technet send the following message: SET Technet NOMAIL
Search previous postings at: www.ipc.org > On-Line Resources & Databases > E-mail Archives
Please visit IPC web site (http://www.ipc.org/html/forum.htm) for additional
information, or contact Keach Sasamori at [log in to unmask] or 847-509-9700 ext.5315
---------------------------------------------------------------------------------

ATOM RSS1 RSS2