Bonjour a tous!
We have found some internal manufacturing defects in some Multilayers
Ceramic Chip Capacitors. After discovering reliability problems with these
types of capacitors (extreme leakage increasing with time) we have decided
to perform a construction analysis. The type of issues found relates to
misalignment of electrodes, electrode layers varying in length, warping of
dielectric plates. Unfortunately, to be able to find these manufacturing
defect we had to do a caps microsection. Now that we know that these
capacitor are prone to manufacturing defects, I would like to know if there
is any way (processes, low cost equipment or service house) to detect these
defects without scraping or damaging the caps? Originally I was thinking
that these could be X-rayed but I am not sure that the resolution would be
sharp enough. I would really appreciate if anyone could help me with this
important problem.

Thank you and good day!

Nicole Landreville, Eng.
Electrical & Supplier QC Engineer
World Heart Corporation
Ottawa, Ontario

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