Could any of you point me in the right direction to answer this question:

Among failures of Field Effect Transistors what proportion of them consist
of a gate shorted to the drain?   Do you know of any studies which would
contain this information?

This is a semiconductor issue but I know many of you are knowledgeable in
this area or know those who are.

Thanks.

---------------------------------------------------------------------------------
Technet Mail List provided as a free service by IPC using LISTSERV 1.8d
To unsubscribe, send a message to [log in to unmask] with following text in
the BODY (NOT the subject field): SIGNOFF Technet
To temporarily halt delivery of Technet send the following message: SET Technet NOMAIL
Search previous postings at: www.ipc.org > On-Line Resources & Databases > E-mail Archives
Please visit IPC web site (http://www.ipc.org/html/forum.htm) for additional
information, or contact Keach Sasamori at [log in to unmask] or 847-509-9700 ext.5315
---------------------------------------------------------------------------------