Easiest ? Amazon.
> -----Original Message-----
> From: James-Kester [SMTP:[log in to unmask]]
> Sent: Sunday, February 18, 2001 8:15 PM
> To: [log in to unmask]
> Subject: Re: [TN] Book Review - SPC For SMT
>
> Dear sir ,
>
> Could you please advise the easist way to buy this book ? Many thanks !
>
>
> James Wang
>
>
> -----Original Message-----
> From: TechNet [mailto:[log in to unmask]] On Behalf Of David Fish
> Sent: Friday, February 16, 2001 1:20 PM
> To: [log in to unmask]
> Subject: [TN] Book Review - SPC For SMT
>
> Title: Statistical Process Control For Surface Mount Technology
> Author: William Samuel Messina
> Publisher: Data Sleuths [8311 E. Via De Ventura #2075, Scottsdale, AZ
> 85258, Phone: 602-321-0549, E-Mail: [log in to unmask]]
> ISBN #: 0967503396
> Price: US$ 49.95
> Pages: 265
>
>
>
> "Statistical Process Control For Surface Mount Technology" by William S.
> Messina, Ph.D. gives practical guidance on using statistical process
> control
> [SPC] techniques on the surface mount technology [SMT] production line to
> aid in achieving specified quality levels. In this book, Dr. Messina
> proposes the concept of "data sleuthing" to solve for the "excessive
> variation" on the manufacturing line. In keeping with this "data
> detective"
> theme, he uses quotations culled from A.C. Doyle's Sherlock Holmes stories
> as rules to aid in the appraisal of information.
>
> Dr. William S. Messina is President of Data Sleuths, a consulting firm
> that
> specializes in using statistics to improve the productivity of
> manufacturing
> activities. His Ph.D. in Industrial Engineering is from Arizona State
> University. He has over 25 years of practical experience in the
> application
> of statistical methods in industry. Bill Messina is a lecturer and has
> written two books and published 25 technical articles. He is a co-winner
> of
> the 1994 Brumbaugh Award from the American Society For Quality.
>
> The book is well written with limited jargon and is accessible by those
> that
> barely remember the words "Central Limit Theorem", much less recall what
> it
> means. It uses cross-references to tie sections of the book together and
> make it easier to recall ideas. Rather than a dry textbook on statistics,
> examples within chapters and in the case studies are from the SMT assembly
> line and are wonderful aids for reinforcing the lessons of the text and
> for
> visualizing practical, on-line uses for statistical analysis. A greater
> attention to editorial detail would improve the book. Also, a chapter on
> applying SPC methods to both production in small lot sizes and production
> ramp-up of a new product would be nice. And just once, I wish that a
> statistician would explain how to calculate tolerance, instead of saying
> "tolerance is provided by your customer." Good theory, but my customers
> don't have clue.
>
> "The Methods of Data Sleuthing," Part I of the book discusses the tools
> and
> methods for data sleuthing in detail. It contains the following chapters:
>
> Chapter 1: "The Concept of Data Sleuthing" explains the practice of using
> statistical methods and strategies to detect, identify, and eliminate
> "excessive variation" in production. Data sleuthing has three elements:
> statistical tools, manufacturing strategies, and axioms [rules] for
> deductive reasoning and logic.
>
> Chapter 2: "The Initial Examination of the Data" describes statistical
> measures and graphical methods to explain "excessive variation".
>
> Chapter 3: "The Basic Tools of Data Sleuthing" provides an understanding
> of
> the basics of control charts and process capability indices.
>
> Chapter 4: "The Intermediate Tools For Data Sleuthing" suggests cumulative
> sum and exponentially moving average control charts as alternatives to the
> Shewhart Chart and gives approaches to developing process capability
> indices
> for non-normal data and confidence intervals for process capability
> indices.
>
> Chapter 5: "The Advanced Tools For Data Sleuthing" introduces an overview
> of
> analysis of variance, components of variance, regression and correlation,
> and design of experiments.
>
> Chapter 6: "Process Clues" presents tools for categorizing the process
> knowledge developed by using the methods employed in the previous
> chapters.
> These tools include cause and effect diagrams, pareto diagrams, IDEF0
> modeling, process FMEA, and an SPC Roadmap.
>
> Part II: "The Casebook of Data Sleuthing" presents eleven case studies
> that
> apply the concepts of data sleuthing to the SMT assembly line.
>
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