Dear sir ,
Could you please advise the easist way to buy this book ? Many thanks !
James Wang
-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of David Fish
Sent: Friday, February 16, 2001 1:20 PM
To: [log in to unmask]
Subject: [TN] Book Review - SPC For SMT
Title: Statistical Process Control For Surface Mount Technology
Author: William Samuel Messina
Publisher: Data Sleuths [8311 E. Via De Ventura #2075, Scottsdale, AZ
85258, Phone: 602-321-0549, E-Mail: [log in to unmask]]
ISBN #: 0967503396
Price: US$ 49.95
Pages: 265
"Statistical Process Control For Surface Mount Technology" by William S.
Messina, Ph.D. gives practical guidance on using statistical process control
[SPC] techniques on the surface mount technology [SMT] production line to
aid in achieving specified quality levels. In this book, Dr. Messina
proposes the concept of "data sleuthing" to solve for the "excessive
variation" on the manufacturing line. In keeping with this "data detective"
theme, he uses quotations culled from A.C. Doyle's Sherlock Holmes stories
as rules to aid in the appraisal of information.
Dr. William S. Messina is President of Data Sleuths, a consulting firm that
specializes in using statistics to improve the productivity of manufacturing
activities. His Ph.D. in Industrial Engineering is from Arizona State
University. He has over 25 years of practical experience in the application
of statistical methods in industry. Bill Messina is a lecturer and has
written two books and published 25 technical articles. He is a co-winner of
the 1994 Brumbaugh Award from the American Society For Quality.
The book is well written with limited jargon and is accessible by those that
barely remember the words "Central Limit Theorem", much less recall what it
means. It uses cross-references to tie sections of the book together and
make it easier to recall ideas. Rather than a dry textbook on statistics,
examples within chapters and in the case studies are from the SMT assembly
line and are wonderful aids for reinforcing the lessons of the text and for
visualizing practical, on-line uses for statistical analysis. A greater
attention to editorial detail would improve the book. Also, a chapter on
applying SPC methods to both production in small lot sizes and production
ramp-up of a new product would be nice. And just once, I wish that a
statistician would explain how to calculate tolerance, instead of saying
"tolerance is provided by your customer." Good theory, but my customers
don't have clue.
"The Methods of Data Sleuthing," Part I of the book discusses the tools and
methods for data sleuthing in detail. It contains the following chapters:
Chapter 1: "The Concept of Data Sleuthing" explains the practice of using
statistical methods and strategies to detect, identify, and eliminate
"excessive variation" in production. Data sleuthing has three elements:
statistical tools, manufacturing strategies, and axioms [rules] for
deductive reasoning and logic.
Chapter 2: "The Initial Examination of the Data" describes statistical
measures and graphical methods to explain "excessive variation".
Chapter 3: "The Basic Tools of Data Sleuthing" provides an understanding of
the basics of control charts and process capability indices.
Chapter 4: "The Intermediate Tools For Data Sleuthing" suggests cumulative
sum and exponentially moving average control charts as alternatives to the
Shewhart Chart and gives approaches to developing process capability indices
for non-normal data and confidence intervals for process capability indices.
Chapter 5: "The Advanced Tools For Data Sleuthing" introduces an overview of
analysis of variance, components of variance, regression and correlation,
and design of experiments.
Chapter 6: "Process Clues" presents tools for categorizing the process
knowledge developed by using the methods employed in the previous chapters.
These tools include cause and effect diagrams, pareto diagrams, IDEF0
modeling, process FMEA, and an SPC Roadmap.
Part II: "The Casebook of Data Sleuthing" presents eleven case studies that
apply the concepts of data sleuthing to the SMT assembly line.
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