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November 2000

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Subject:
From:
Kang Zhang <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Thu, 30 Nov 2000 15:25:59 -0500
Content-Type:
text/plain
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text/plain (70 lines)
Here it is.

Good luck

Kang


>From: "Pelkey, Glenn" <[log in to unmask]>
>Reply-To: "TechNet E-Mail Forum." <[log in to unmask]>,        "Pelkey, Glenn"
><[log in to unmask]>
>To: [log in to unmask]
>Subject: Re: [TN] Temperature Cycle to product life
>Date: Thu, 30 Nov 2000 09:20:34 -0800
>
>Hi Lee, Werner,
>
>         That "B" version was not easy to find.  I couldn't find it on the
>Jedec website or one of two document resellers.  The reseller that did have
>it shows it was issued 7/00/00 (interesting date).  "A" version only goes
>to
>section 4.0, so I'm looking forward to the revision.
>
>Glenn
>
> > -----Original Message-----
> > From: Werner Engelmaier [SMTP:[log in to unmask]]
> > Sent: Wednesday, November 29, 2000 6:20 PM
> > To:   [log in to unmask]
> > Subject:      Re: [TN] Temperature Cycle to product life
> >
> > Hi Lee,
> > You are quoting the wrong part of the JEDEC Standard. According to JEDEC
> > Test
> > Method, JESD22-A104-B, Section 5.7.2 warns specifically against high
>ramp
> > rates for solder joint testing.
> >
> > Werner Engelmaier
> > Engelmaier Associates, L.C.
> > Electronic Packaging, Interconnection and Reliability Consulting
> > 7 Jasmine Run
> > Ormond Beach, FL  32174  USA
> > Phone: 904-437-8747, Fax: 904-437-8737
> > E-mail: [log in to unmask], Website: www.engelmaier.com
> >
>
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