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October 2000

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Subject:
From:
John Lynch <[log in to unmask]>
Reply To:
Leadfree Electronics Assembly E-Mail Forum.
Date:
Mon, 9 Oct 2000 10:18:16 -0700
Content-Type:
text/plain
Parts/Attachments:
text/plain (194 lines)
Jeff:

What is the Amkor test and guarantee?

John Lynch
ON Semiconductor

Jeff Cannis wrote:
> 
> Just as important,
> 
> In the absence of an industry standard test method, how does one prove that a
> coating is whisker free? There have been a number recent papers proposing
> various test conditions, but none have been adopted by any industry group. Any
> data presented on whisker growth, or suppression, is somewhat arbitrary until we
> all agree on a valid method to accelerate whisker growth.
> 
> Regards,
> Jeff Cannis
> Amkor Technology
> 
> Kirk D Mueller <[log in to unmask]> on 10/05/2000 09:41:49 AM
> 
> Please respond to "Leadfree Electronics Assembly E-Mail Forum."
>       <[log in to unmask]>; Please respond to Kirk D Mueller
>       <[log in to unmask]>
> 
>  To:      [log in to unmask]
> 
>  cc:
> 
>  Subject: Re: [LF] Tin whiskers on tin-dipped terminations
> 
>      OK, how does one inhibit tin whisker formation in a pure tin coating?
> 
> Yun Zhang <[log in to unmask]>@IPC.ORG> on 10/05/2000 09:08:32 AM
> 
> Please respond to "Leadfree Electronics Assembly E-Mail Forum."
>       <[log in to unmask]>; Please respond to [log in to unmask]
> 
> Sent by:  Leadfree <[log in to unmask]>
> 
> To:   [log in to unmask]
> cc:
> Subject:  Re: [LF] Tin whiskers on tin-dipped terminations
> 
> I concur with Mr. Petit on a number of things:
>    One does not have to use SEM to see a long whisker (e.g., length > 50
> 
>   ------------------------------------------------------------------------
> 
> µm).
>    So long as one learned to know what to look for, it is not a difficult
> task
>    to find a relatively long one.   It is those tiny ones (< 5 µm in both
> length
>    and diameter) that are most challenging, and would need a SEM with high
>    magnifications to see them.
>    Whiskers do not readily grow on all substrates.  Brass is one of the
> worse,
>    pure copper is one of the best substrates.
>    The electronic industry can come up with reliable tin coatings to
> replace
>    tin/lead coatings.
> 
> I would also like to add that there are ways to minimized the propensity of
> whisker formation besides using a barrier layer and reflow.  The kinetics
> of
> whisker growth from the tin layer may be effectively controlled.
> 
> Regards,
> 
> Yun Zhang
> Lucent Technologies
> Electroplating Chemicals and Services
> 
> [log in to unmask] on 10/05/2000 03:02:47 AM
> 
> Please respond to "Leadfree Electronics Assembly E-Mail Forum."
>       <[log in to unmask]>; Please respond to [log in to unmask]
> 
> To:   [log in to unmask]
> cc:    (bcc: Yun Zhang/ECSDOMAIN)
> 
> Subject:  Re: [LF] Tin whiskers on tin-dipped terminations
> 
>      Tin whiskers can be found by binocular microscope at X20 to X50 but
>      confirmation that the visible protrusion is really a whiskers may
>      require SEM observation as other plating defect may look as a
>      whiskers.
> 
>      In the case of the component their  are two issues about whiskers:
>      what is the maximum length of such defect which is not giving any
>      trouble;
>      on a ceramic capacitor who cares about a 50µm whisker , even 100µm
> 
>      then come immediaytely the second issue :
> 
>      is the growth stopped for ever or is it a growing whiskers or a
>      potentially growing one .
> 
>      It is true that whiskers do not grow on every base materials
>      and i am confident the electronic industry can come to a reliable
>      solution with tin coatings as replacement of tin-lead.
> 
>      regards
> 
>       L.Petit
>      ST Microelectronics
> 
> ______________________________ Reply Separator
> _________________________________
> Subject: Re: [LF] Tin whiskers on tin-dipped terminations
> Author:  gordon.davy ([log in to unmask]) at internet
> Date:    10/4/00 11:24 PM
> 
> James Canner of Murata stated that he has ceramic capacitor chips with
> electroplated tin terminations that are over ten years old that have "no
> visible tin whisker formation." There was a big discussion at Works 2000
> about tin whiskers. One thing that I learned is that you have to use
> scanning electron microscopy to look for them. While they may grow to a
> length of several millimeters, the diameter is on the order of a micrometer
> - close to the diffraction limit for optical microscopy. I am sure that
> some
> of the tin whisker experts must be subscribed to the leadfree forum, and I
> would think that someone would be interested in looking for whiskers on a
> ten-year-old tin plated surface.
> 
>         Gordon Davy
> 
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