We use a Gerber (oops, Barco) Accumatch, which compares pixel-to-pixel the
Gerber data to the image seen by the AOI camera. It's slower than design
rule checking, but has definite advantages, throughput not among them.

Timothy Reeves
QA Manager/Process Engineer
ECD Circuit Board Division
13626 S. Freeman Road
Mulino, OR 97042
(800) 228-8198    Fax (503) 829-5482


|-----Original Message-----
|From: Peter Menuez [mailto:[log in to unmask]]
|Sent: Friday, September 01, 2000 6:55 PM
|Subject: Re: Automatic Optical Test (AOT)
|
|
|Franklin,
|
|Besides the problems with AOI that have been addressed
|in several other emails there is a potential problem
|of the AOI itself.  Most of the AOI's that I am
|familiar with use 'design rule' checks rather than an
|actual comparison of real data to real product.
|
|Maybe someone out there in Technet Land could expand
|on design rule checking because I don't know much
|about it, but this alone would make me nervous.
|
|Pete
|
|
|
|
|
|--- Franklin D Asbell <[log in to unmask]>
|wrote:
|> Just read an article in "The Board Authority"
|> regarding Automatic
|> Optical Test (AOT).
|>
|> Just wondering what you assemblers or purchasers of
|> bare boards thoughts
|> are on fabricators performing 'optical testing'
|> (visual, AOI)  instead
|> of 'contact testing' (BON, probe)????
|>
|> An example: You state all boards to be electrically
|> tested for
|> opens/shorts, and instead of throwing the boards on
|> our flying probe or
|> bed-of-nails equipment I decide to put this on my
|> AOI after setting it
|> up to flag for opens/shorts, would you be satisfied
|> with this method?
|>
|> Franklin D Asbell
|> Network Circuits, Inc.
|> Irving, Texas 75061
|>
|>
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