Franklin,

Interesting concept. As an  assembler, I would prefer to see the contact
test performed in an attempt to find all the 'little hairs' so to speak. Now
I also know that technology has made AOI pretty good, so I would be open to
determining if AOI could catch everything that may come along! Got data?

Richard Hamilton
Clemar Mfg. / Rain Bird
[log in to unmask]

> -----Original Message-----
> From: Franklin D Asbell [SMTP:[log in to unmask]]
> Sent: Friday, September 01, 2000 10:29 AM
> To:   [log in to unmask]
> Subject:      [TN] Automatic Optical Test (AOT)
>
> Just read an article in "The Board Authority" regarding Automatic
> Optical Test (AOT).
>
> Just wondering what you assemblers or purchasers of bare boards thoughts
> are on fabricators performing 'optical testing' (visual, AOI)  instead
> of 'contact testing' (BON, probe)????
>
> An example: You state all boards to be electrically tested for
> opens/shorts, and instead of throwing the boards on our flying probe or
> bed-of-nails equipment I decide to put this on my AOI after setting it
> up to flag for opens/shorts, would you be satsified with this method?
>
> Franklin D Asbell
> Network Circuits, Inc.
> Irving, Texas 75061
>

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