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August 2000

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Subject:
From:
"fraley , barrie" <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Wed, 23 Aug 2000 10:19:08 -0400
Content-Type:
text/plain
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text/plain (74 lines)
ISBN: 0-471-97966-X
Accelerated Reliability Engineering
HALT and HASS
by Gregg K. Hobbs

-----Original Message-----
From: Craig Hillman [mailto:[log in to unmask]]
Sent: Tuesday, August 22, 2000 5:55 PM
To: [log in to unmask]
Subject: Re: [TN] Practical Book on ESS (Environmental Stress
Screening).


Quality Conformance and Qualification of Microelectronic Packages
and Interconnects by Pecht, Dasgupta, Evans, and Evans

On 22 Aug 00, at 13:24, Ken Patel wrote:

> All,
> Looking for any good practical book on ESS (Environmental Stress
> Screening).
>
> re,
> ken patel
>
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Dr. Craig Hillman
CALCE Electronic Products and Systems Consortium
University of Maryland
College Park, MD  20742
(301)-405-5316
[log in to unmask]

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