Special Meeting to Discuss IPC CAT Standard
Monday, September 11, 2000
8:00am - 12:00pm 

Tim Estes, Conductor Analysis Technologies (CAT) 

This meeting will focus on CAT Technology as an IPC standard for use by OEMs and PCB fabricators. This testing and analysis technology provides data that quantifies the capability and quality of a process to manufacture-specific features. Conductor and space defect density, conductor width and height uniformity, via to layer(s) registration, via defect density and resistance uniformity, soldermask registration and controlled impedance data are determined from analysis of specialized test patterns. The results provide design rules for the process and document the current capability and quality of the process. 

For more information about IPC Works 2000 please visit our website at http://www.ipc.org or email me at [log in to unmask] 


Nick Ban

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