In a message dated 7/19/00 1:02:02 PM US Eastern Standard Time,
[log in to unmask] writes:

>
>  If the time to failure is known (10 months) how can I develop an internal
>  stress test to facilitate a failure in less times (like 3 weeks)
>  I don't have a HALT chamber, but two thermal chambers

Jason

What is the failure you are investigating?  Dendritic growth?  Cracked solder
joints? To develop an accelerated test method depends on the mechanism you
want to accelerate.
>
>  The stresses that I want to use are
>
>  high temp (85 degrees C)
>  low temp (-40 degrees C)
>  salt water bath
>  powered cycle

All at once, or uniquely different tests?
>
>  The module is encapsulated, weight approx. 0.3 Kg,
>
>  PS: I don't like calculus!!!

No one does.
>
>  Thanks for your help
>
>  Jason Larson

Pat Kane
Technical Sales Manager
Contamination Studies Laboratories
>

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