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July 2000

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Subject:
From:
Grant Emandien <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Thu, 20 Jul 2000 12:40:34 +0200
Content-Type:
text/plain
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text/plain (95 lines)
Hi All,

On the subject of HALT and HASS, how effective are these approaches to
improving reliability and how beneficial has this been in your value-adding
process?

Regards
Grant

-----Original Message-----
From: Ketan Bhatt [mailto:[log in to unmask]]
Sent: Thursday, July 20, 2000 7:33 AM
To: [log in to unmask]
Subject: [TN] Fw: Thermal stress/shock profile for loaded board


Hi Ken,

HALT ( Highly Accelerated Life Test ) for design verification and HASS
 Highly Accelerated Stress Screening) for production screening are the
methods for precipitating infant failures in the manufacturing shop.

In HASS, you apply Thermal shock (room temp -> -100 deg C  -> +100 deg C at
the rate of 60 deg C / min) along with vibration (level to be decided based
on your design specs).

Typically one cycle of HASS is equivalent to one year's of product of life.
You can decide about extent of HASS based on your post HASS failures and
field failure.

Good luck !!!

Best Regards,

Ketan Bhatt.
Secure Meters Limited.
Phone : (o) : +91-294-492300  (r) +91-294-527723
Email   : [log in to unmask]
----- Original Message -----
From: "Ken Patel" <[log in to unmask]>
Sent: Thursday, July 20, 2000 3:14 AM
Subject: Thermal stress/shock profile for loaded board


> Reliability/Quality Expert,
> How can I select the thermal stress/shock profile for loaded board if I
want
> to precipitate the fab problem. Boards are functionally passed but belongs
> to suspect date code.
>
> I am looking for a profile in the following format.
>
> Min Temp:
> Max temp:
> Ramp rate:
> Soak time:
> Total # of cycles:
>
> re,
> ken patel
> ______________________________________________________
> Ken Patel                       Phone:  (408) 490-6804
> 1708 McCarthy Blvd.             Fax:    (408) 490-6859
> Milpitas, CA 95035
>

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