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Reply To: | TechNet E-Mail Forum. |
Date: | Wed, 19 Jul 2000 17:35:24 +0800 |
Content-Type: | text/plain |
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Hello Guys,
Anyone knows a non contact probe testing than can be applied
in characterizing semiconductor device, ex. SOIC?
I mean it can give results on RDSon, Igss, Bvdss, etc. with high accuracy?
Any inputs are highly appreciated
thank you so much
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