Poh
I'm still a little unclear what you mean by "quantify". If you mean the weight per unit
area, see my previous posting, but I still don't think that knowing this will do you
any good.
If you mean that you want a process control - as opposed to a qualification method -
then ionic contamination testing is a valid method, even though the absolute values are
meaningless. To implement this, measure, say, 20 boards of a single type that you are
satisfied that are as you want them by qualification tests on some of their sisters,
and note their values. Calculate the mean and standard deviation. If your process is
well-mastered, the SD will be small. Subsequent random tests (say 5 or so per day)
should ideally change neither the mean nor the SD, but you may expect minor random
variations. If, on the other hand, you see a specific tendency for the values to drift,
either up or down, you will know that your process is going off the rails. I find that
plotting a running average curve over the last 6 measurements is a very useful tool to
warn you of such process changes and some instruments will do this for you
automatically. You have an expert in this in Singapore: ask for Loke at Multicore
Solders in Jurong ([log in to unmask]).
Brian
Poh Kong Hui wrote:
> Hi Again,
>
> In the previous Email, I did not make myself clear for everyone
> to understand what I meant 'to quanify flux residue'.
>
> In fact, I am looking for way to measure & quantify the flux
> residue that left after wave soldering process, using no-clean
> flux.
>
> I understand using clean process, ionic contamination is one of
> the way of measuring the residue, however, it is mainly for clean
> process.
>
> Please advise me. Thanks you.
>
> Poh
>
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