Silent as in a desert. I'll make another try here: anyone who uses MIL-STD-883 Method 2032.1 for inspection of wafers and chips? My question was: what's the difference between this one and Method 2010, 2017?  Method 2032.1 have more pages, and more issues, but in many aspects they seem to be all the same. Hoped that some NASA, Grumman, Sandia or other guy had a clue. I also had a following question about MIL-STD-883 vs. ATL QCIM.  Many seem to abandon MIL-STD for other norms.

Sigh! I don't love MIL-STD either, but I have to deal with it sometimes. Double sigh!


> Ingemar Hernefjord
> Ericsson Microwave Systems

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