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June 2000

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Subject:
From:
Brooks Bill <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Thu, 1 Jun 2000 10:24:59 -0700
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I am curious about de-panelization of V-scored boards as well. I have seen
different recommendations as to the depth of score, angle of score, method
of depanelization. Does anyone have a tried and true combination that works
without failure...? Also, I would imagine that different materials would
lend themselves to different treatment. (In the past I did some boards that
were punched (die-cut) and we changed the material to be more compatible
with the process.)  I understand that some shops cut v-scores with saws and
some use routing tools from both sides of the board at the same time. Any
other reference material out there that we can look at?
- Bill Brooks


 -------------------------------------
| Bill Brooks, Sr. PCB Designer
| Zoneworx, Inc.
| 40925 County Center Drive, STE 200
| Temecula, CA 92591
| [log in to unmask]
| www.zoneworx.com
| Tel: (909) 296-1226 x 1037
 -------------------------------------


-----Original Message-----
From: KK Chin [mailto:[log in to unmask]]
Sent: Thursday, June 01, 2000 10:12 AM
To: [log in to unmask]
Subject: Re: [TN] V-Score--stress


John Maxwell discouraged using rolling blade shear but recommended water jet
cutting for depaneling. Does any body know who makes such water jet cutter?
Any
users out there who can share some experience?

Thanks,
KK Chin
Artesyn Technologies
Fremont, CA




Gabriela Bogdan <[log in to unmask]> on 06/01/2000 09:25:55 AM

Please respond to "TechNet E-Mail Forum." <[log in to unmask]>; Please respond
to
      Gabriela Bogdan <[log in to unmask]>

To:   [log in to unmask]
cc:    (bcc: KK Chin)

Subject:  Re: [TN] V-Score--stress



Being one of John Maxwell's "fans" I recommend his articles about design for
manufacturability . Concerning chip capacitors, we follow as much as
possible
the rules
, and Dwight's comments are in this spirit. Most of the failures we also
encountered
were with chip capacitors, and the separation method , the distance from the
edge, and
the orientation of the chip were the culprits, alone or in combination. We
had
for
instance one panel with circuits which were manufactured first as single,
then
as 4 in
panel. Due to the proximity of the chip cap to the edge, we had failures
after
separation, and had to change the artwork accordingly.
Gaby

Dwight Mattix wrote:

> We score many designs.  It's a really useful process to optimize panel
> utilization and sometimes assy tooling/depaneling tradeoffs.  However, our
> experience here shows your concerns are valid.  I suggest the even bigger
> concern should be the risk of latent defects that will pass through all
> your tests and into the field.
>
> We've seen the risk to be with ceramic chip components (chip caps et al)
> within .1 - .2" of the score.  The mode is latent ceramic cracking leading
> to leakages or outright device failure.  Either way the end result is the
> same -- field infant mortality.
>
> As a result of our experience (read scar tissue -- and some crude long
> forgotten rel experiments way back in the early 90's dark ages -- Phil
> Bavaro may have better memory of that) our design rules don't allow
scoring
> if chip components are within 0.200" of the score. The exception to the
> rule we sometimes make is when the assembly has shields soldered out to
> board edge effectively making a box beam that stops/reduces flex of the
pwb.
>
> I'd be real interested to hear what others have learned and design rules
> they maintain -- esp if there's been some science applied to their
> establishing their rules.
>
> Dwight
>
> At 11:01 AM 6/1/00 -0400, Ed Holton wrote:
> >We have recently started using boards with V-score for the panelization
and
> >we have a debate raging here.  There is a concern about separating the
> >boards before versus after the incircuit test and whether there is the
> >possibility that there is imparted stress to the board that could create
a
> >failure mechanism that might have been caught at the ICT and not at the
> >functional test, thus the requirement to singulate before versus after
ICT.
> >I have read various articles, but am wondering what people have found in
> >the real world.
> >
> >Thanks
> >
> >Ed Holton
> >Manufacturing Engineer and Group Leader
> >Hella Electronics
> >Telephone (734) 414-0944
> >Fax (734) 414-0941
> >
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