Anyone who has some good articles about EOS(Electrical OverStress) and FBSOA/RBSOA (Fwd/ReBasedSafeOperatingArea) for FETs and transistors. The reason is that I need better knowledge about heat induced failure mechanisms. I´m sure someone of you have. Thx in advance,
Ingemar Hernefjord
Ericsson Microwave Systems
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