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June 2000

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TechNet <[log in to unmask]>
Subject:
Reliability Prediction Methods
From:
Kang Zhang <[log in to unmask]>
Date:
Tue, 13 Jun 2000 01:41:25 EDT
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text/plain; format=flowed
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"TechNet E-Mail Forum." <[log in to unmask]>, Kang Zhang <[log in to unmask]>
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text/plain (33 lines) 
Hello all

Two questions:

1. Is there any big difference in reliability prediction results between
using MIL-HDBK-217F notice2 and using Bellcore? I just try MIL. Using
Bellcore can get "better" MTBF or "worse"?

2. Except the above two, are there any other methods to predict the
reliability of electronic components, such as FET, Bipolar?

Any inputs are very welcome. Thanks in advance!

Kang


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