TECHNET Archives

May 2000

TechNet@IPC.ORG

Options: Use Monospaced Font
Show Text Part by Default
Show All Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Subject:
From:
"<Joseph M. Webb>" <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Tue, 9 May 2000 10:14:24 -0400
Content-Type:
text/plain
Parts/Attachments:
text/plain (27 lines)
If you have a discrete sample of tin/lead of a given true ratio, an XRF analysis
should return that value with some amount of reasonable error. In the case of a
solder deposit on a copper substrate it is typical to detect an elevated level
of tin as the deposit become thinner due to the natural alloying of tin and
copper forming the intermetallic increasingly deficient in lead as you get
thinner. The Cu/Sn alloy become more prevalent, the Sn/Pb less so, thus the
higher tin values.

Hope that helps.

Joseph Webb
TET Halco

##############################################################
TechNet Mail List provided as a free service by IPC using LISTSERV 1.8c
##############################################################
To subscribe/unsubscribe, send a message to [log in to unmask] with following text in
the body:
To subscribe:   SUBSCRIBE TECHNET <your full name>
To unsubscribe:   SIGNOFF TECHNET
##############################################################
Please visit IPC web site (http://www.ipc.org/html/forum.htm) for additional
information.
If you need assistance - contact Keach Sasamori at [log in to unmask] or
847-509-9700 ext.5315
##############################################################

ATOM RSS1 RSS2