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May 2000

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TechNet <[log in to unmask]>
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[log in to unmask]
Date:
Wed, 31 May 2000 12:02:33 EDT
Reply-To:
"TechNet E-Mail Forum." <[log in to unmask]>, [log in to unmask]
Subject:
Re: Measurement of flux residue
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From:
Douglas Pauls <[log in to unmask]>
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In a message dated 05/31/2000 10:39:40 AM US Eastern Standard Time,
[log in to unmask] writes:

> You can measure the ionic contamaination levels.  An Omegameter works well.

As a process control tool yes.  As a measure of cleanliness for accept-reject
- no way.  Inquirin' minds should read EMPF report RR0013, "An In Depth Look
At Ionic Cleanliness Testing", done in conjunction with the IPC Ionic
Conductivity Task Group about 5 years ago.  It should be available from
www.empf.org.

Doug Pauls

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