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May 2000

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"Jason Larson, AScT" <[log in to unmask]>
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Fri, 19 May 2000 11:59:52 -0700
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"TechNet E-Mail Forum." <[log in to unmask]>, "Jason Larson, AScT" <[log in to unmask]>
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Good day Technet,

What are some typical tests used for raw goods analysis, in particular zener
diode, capacitors and FET's?

Thanks in advance

Jason Larson

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