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February 2000

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Subject:
From:
Graham Naisbitt <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Fri, 28 Jan 2000 17:09:01 -0000
Content-Type:
text/plain
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text/plain (123 lines)
Phew!

Regards,
Graham Naisbitt

[log in to unmask]

WEB: http://www.concoat.co.uk

CONCOAT Ltd
Alasan House, Albany Park
CAMBERLEY GU15 2PL UK

Tel: +44 (0) 1276 691100  Fax: +44 (0) 1276 691227
----- Original Message -----
From: <[log in to unmask]>
To: <[log in to unmask]>; <[log in to unmask]>
Sent: 28 January 2000 12:56
Subject: Re: [TN] SIR TESTING


> In a message dated 01/27/2000 1:06:45 PM US Eastern Standard Time,
> [log in to unmask] writes:
>
> >
> >  With the greatest possible respect to SIR Doug (and I really do not
relish
> >  such a challenge!) I consider that there is a way that permits /
> facilitates
> >  at least a reasonable comparison.
>
> Aww stop it, you're embarrassin' me.
>
> >
> >  If you process your test coupons using EXACTLY the same manufacturing
> >  processes AND chemistries that your final production assembly will see,
> then
> >  you have a pretty accurate picture of the results you can expect in
> >  production.
>
> Yes.  This is a conversation that I have with many clients when we talk
about
> qualifying a manufacturing process.  In MIL-STD-2000 and J-STD-001A, the
> IPC-B-36 test board was used as the substrate with bare copper
metalization,
> no solder mask (or very little), FR-4 laminate, and precleaned.  The
question
> that came up frequently was "how representative was this of the residue
load
> on actual product that was masked with tin-lead, possibly conformally
> coated?"  A good question.  When Appendix D of J-STD-001B was written, we
> stipulated that the test substrate, whatever was used, needed to be made
by
> your fabricators, with your laminate, with your mask, processed with your
> fluxes and pastes, and coated with your coatings.  This made the test
vehicle
> much more representative of the residue load your product would be
expected
> to have.
>
> Although the C revision of J-STD-001 is almost finished, the approach in
the
> current Appendix D is not changed measurably, other than to become
Appendix
> B.  Hey, a few more revs and we might work it up into the document itself.
>
> >
> >  We here, have been carrying out extensive SIR test projects which may
well
> >  form the basis of new "Process Validation Test" standards.
>
> Graham is a little spam-shy.  He is talking about frequent monitoring
where
> measuring SIR on an hourly, or more frequent basis, may yield as much
useful
> information in 24 hours as we now get in 7 days.  Brian Ellis of
Protonique
> has also presented a few papers on using an 8 hour SIR test to predict
longer
> term SIR performance.
>
> >
> >  Naturally the test coupon MUST lend itself to such tests i.e.: it MUST
be
> >  able to accept component overmounting of the test patterns so that you
can
> >  best mimic production circumstances.
>
> A good point.  Components give all kinds of shielding effects that you
don't
> see with a purely flat test board.  One important item to note is that if
> your test pattern examines the insulation resistance from mounting pad to
> mounting pad, then the component you use MUST have no internal die inside.
> These are usually special orders.  If you order such parts from TopLine,
make
> sure it has the -ISO extention (stands for ISOLATED).
>
> >
> >  Of course if you were able to make available a redundant area
underneath
> >  components the could be home for a test site/pattern, then you have the
> >  better circumstance.
>
> Yup.
>
> Doug Pauls
> CSL
>

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