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February 2000

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Subject:
From:
龍崇智 (C.J.Long) P00_2300 <[log in to unmask]>
Reply To:
TechNet E-Mail Forum. <[log in to unmask]>
Date:
Wed, 23 Feb 2000 11:09:00 +0800
Content-Type:
text/plain
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Greeting:

I am looking for a non-destructive instrument capable measureing solder mask
via capping thickness. Thickness range is 50 - 90 % of substrate thickness
 62 mil thick ). Instrument capability shall pass GR&R requirement ( 6 sigma
< than 30% of target tolerance " 40% of 62 mil " ) and correlation to cross
section.
Anyone knows this, please share with me. Thank you.

Best regards,

C.J. Long
Compeq Manufacturing

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