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Wed, 26 Jan 2000 16:37:51 -0500 |
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> -----Original Message-----
> From: Chafin, Ken G.
> Sent: Friday, January 21, 2000 9:01 AM
> To: [log in to unmask]
> Subject: FW: Tantalum Dielectric Break
>
>
>
> -----Original Message-----
> From: Chafin, Ken G.
> Sent: Thursday, January 20, 2000 6:09 PM
> To: [log in to unmask]
> Subject: FW: Tantalum Dielectric Break
>
>
>
> -----Original Message-----
> From: Chafin, Ken G.
> Sent: Thursday, January 20, 2000 6:02 PM
> To: [log in to unmask]
> Subject: Tantalum Dielectric Break
>
> Does any of you know the temperature (or temperature range) at which the
> tantalum pentoxide dielectric in solid tantalum capacitors converts (or
> begins to convert) from the amorphous to the crystalline (current leaking)
> state? For simplicity, I'll assume there are no other independent stress
> factors operative.
>
> Anyone know where I can find the answer in a technical reference/article
> of some sort?
>
> Thanks for any clues you may have.
>
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