TECHNET Archives

December 1997

TechNet@IPC.ORG

Options: Use Monospaced Font
Show Text Part by Default
Show All Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Subject:
From:
JOHN OSULLIVAN <[log in to unmask]>
Reply To:
TechNet Mail Forum.
Date:
Thu, 11 Dec 1997 12:52:04 -0400
Content-Type:
text/plain
Parts/Attachments:
text/plain (34 lines)
  REGARDING           Screenprint process control

I am setting up a Cyberoptics LSM2 unit to measure and monitor paste height
and volume of deposits on PCBs.

I am wondering what is the most accepted method of measuring paste when
selecting a baseline. ie, with the LSM you can measure from the top of paste
to the soldermask, top of paste to substrate, or if there is any uncovered pad
from the top of paste to the pad.

Really I'm asking if it ok/accepted to measure from soldermask or substrate to
top of paste. Is soldermask thickness consistant enough to do this or will the
substrate be etched somewhat to introduce another variable.

How are other people out there using their paste height measuring equipment to
keep screenprinting under control.

Any comment will be appreciated.

Regards
John O'Sullivan.

##############################################################
TechNet Mail List provided as a free service by IPC using LISTSERV 1.8c
##############################################################
To subscribe/unsubscribe, send a message to [log in to unmask] with following text in the body:
To subscribe:   SUBSCRIBE TECHNET <your full name>
To unsubscribe:   SIGNOFF TECHNET
##############################################################
Please visit IPC web site (http://www.ipc.org/html/forum.htm) for additional information.
For the technical support contact Dmitriy Sklyar at [log in to unmask] or 847-509-9700 ext.311
##############################################################


ATOM RSS1 RSS2