TECHNET Archives

1996

TechNet@IPC.ORG

Options: Use Monospaced Font
Show Text Part by Default
Show All Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Subject:
From:
"Mustala Liisa (NTC/Espoo)" <[log in to unmask]>
Date:
Mon, 12 Feb 96 17:06:00 eet
Content-Type:
text/plain
Parts/Attachments:
text/plain (15 lines)

We would need information and acceptance criteria on thermal shock testing 
of blind and buried vias.
The idea is to design the vias to form chain patterns and measure their 
resistance/resistance change during thermal shock.
Does anyone have experience on this or know of any standard test 
pattern/method/conditions/ acceptance criteria?
Your help is highly appreciated.
Please, respond as soon as possible to IPC TechNet or directly to:
          Liisa Mustala
          Nokia Telecommunications
          e-mail: [log in to unmask]



ATOM RSS1 RSS2