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Date: | Mon, 12 Feb 96 17:06:00 eet |
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We would need information and acceptance criteria on thermal shock testing
of blind and buried vias.
The idea is to design the vias to form chain patterns and measure their
resistance/resistance change during thermal shock.
Does anyone have experience on this or know of any standard test
pattern/method/conditions/ acceptance criteria?
Your help is highly appreciated.
Please, respond as soon as possible to IPC TechNet or directly to:
Liisa Mustala
Nokia Telecommunications
e-mail: [log in to unmask]
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