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June 2000

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Subject:
From:
Brunker Ed <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Tue, 27 Jun 2000 17:49:44 +0100
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There have been millions of hours testing the reliability of electronic
assemblies through thermal cycling. There are countless authorities on this
subject. The reliability of assemblies with regard to mechical shock and
vibration present a different scenario. Are there any references for
information regarding work done in this field?
Regards
Edward Brunker
Principal Process Engineer

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