TECHNET Archives

July 1998

TechNet@IPC.ORG

Options: Use Monospaced Font
Show Text Part by Default
Show All Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Subject:
From:
Carson Ho <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Sat, 4 Jul 1998 13:50:47 PDT
Content-Type:
text/plain
Parts/Attachments:
text/plain (25 lines)
In semiconductor industry, reliability audit program (RAP) or reliability
monitoring is very essential to guarantee the product's reliability
performance in a continsouly manner. My company definitely has such system
in place. However my question is we do not have a statistically sound base
on how many or how frequent should we pull the product samples for
performing various kinds of reliability testings. Is it possible to do so?
How? As you know, RAP is a kind of appraisal cost in COQ, how can we
justify between cost and confidence level? Do your companies face same kind
of issues?

Best regards,
Carson Ho

################################################################
TechNet E-Mail Forum provided as a free service by IPC using LISTSERV 1.8c
################################################################
To subscribe/unsubscribe, send a message to [log in to unmask] with following text in the body:
To subscribe:   SUBSCRIBE TechNet <your full name>
To unsubscribe:   SIGNOFF TechNet 
################################################################
Please visit IPC's web site (http://www.ipc.org) "On-Line Services" section for additional information.
For technical support contact Hugo Scaramuzza at [log in to unmask] or 847-509-9700 ext.312
################################################################


ATOM RSS1 RSS2