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Subject:
From:
"Magee, Andrew P" <[log in to unmask]>
Date:
Fri, 12 Jul 1996 08:25:00 -0700
Content-Type:
text/plain
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     These flex circuits included trace encapsulation with
     polyimide coverfilm. Examination of x-sections showed
     that the dendritic growth was following the field
     lines between traces in the coverfilm adhesive. For
     the materials that were failing, the adhesive itself
     was acting like a solid state electrolyte. The
     incubation period was related to the time it took for
     the ionic level of the adhesive to attack the traces
     and get copper in solution, creating something like a
     plating cell.

     By the way, all of the Rogers R/flex adhesives have
     been tested and are immune to this effect.

     Andy Magee
     [log in to unmask]


     ______________________________ Reply Separator
     _________________________________

     Subject: FW: Re[2]: Humidity Testing
     Author:  Dill, Norm J::(DILLNJ)  at ~FABRIK
     Date:    7/11/96 5:46 AM


     From: Dill, Norm J
     Date: Thu, Jul 11, 1996 5:46 AM
     Subject: FW: Re[2]: Humidity Testing
     To: "'IPC - Technet Input'"

     Andy,
          Considering your test was run at 100 v with a .006"
     spacing, is there any chance that airborne contaminants
     contributed to your 300/500 hour failures?

               Norm Dill
               [log in to unmask]


______________________________ Reply Separator
_________________________________
Subject: Re: Re[2]: Humidity Testing
Author:  SIRGuru::(SIRGUR) at ~FABRIK
Date:    7/12/96 6:00 AM


From: [log in to unmask]
Date: Fri, Jul 12, 1996 6:00 AM
Subject: Re: Re[2]: Humidity Testing To: Magee, Andrew P
Good points, but if I may ask, were the flex circuits
totally capped by the polyimide film, or was it a surface
metalization.  I would agree that it would take longer in
test before failures occur in a totally encapsulated case.
 For the Bellcore coupons, it is a totally surface case,
with no barriers to moisture.

Doug Pauls
CSL
[log in to unmask]

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Date: Fri, 12 Jul 1996 09:00:48 -0400
Message-ID: <[log in to unmask]>
To: [log in to unmask]
Subject: Re: Re[2]: Humidity Testing

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