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June 1997

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Subject:
From:
"Murray, George @ GSC" <[log in to unmask]>
Date:
Fri, 13 Jun 97 15:10:00 PDT
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Rick,
The method we use to check the quality of inspection for our AOI is to use a 
panel with seeded defects.  The defects include opens, shorts, neckdowns, 
mousebites, pinholes, copper splashes, etc of various sizes, typically from 
0.5 mil to 5 mils.  Run the inspection and verify the results just as you 
suggested.

George Murray
[log in to unmask]
 ----------
From: TechNet-request
To: IPC TechNet
Cc: Mark Cowling; Jim Reed; Michael C Heck; Robert A Carhart
Subject: Automated Optical Inspection (AOI) of PCB inner layers
Date: Friday, June 13, 1997 1:36PM

I am looking for a person who has successfully developed a method to 
routinely
check the performance of an AOI used for PCB layers in order to gain some
guidance.

The goal is to verify the machine logic and detection capabilities
daily/weekly
for SPC.  This is to head off a concern that the machine sensitivity may
degrade or just change with out our knowledge.  My thought is using a known
defective image which challenges the machine capability and then check to 
make
sure it provides a consistant rejection list.

Respectfully,  Rick Haynes

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