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Date: | Thu, 18 Apr 96 08:46:29 cst |
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Hello Tracy - you characterized the concerns with electroplate tin
finish very well. Just a couple of comments:
- Tin whiskers can be prevented by "poisoning" the tin bath with a
very small percentage of another element. There have been numerous
papers in the industry on the subject. Bismuth, antimony, lead, etc.
can all be used to prevent the whiskering. I suggest you talk with
your plating supplier and check on what they use to poison their bath.
- I believe that you will have fewer problems with oxidation of
electroplate tin than HASL, that has been my experience with pwbs we
process. We have done quite a bit of SERA solderability testing and
the oxides (SnO and SnO2) that develop can be removed with the fluxes
we are using. There was a paper published within the last year by Urmi
Ray of AT&T on immersion tin that may interest you too (IEEE
Transactions on Components, Packaging, and Manufacturing Technology -
part A, Vol. 18, No.1, March 1995).
David Hillman
Rockwell Collins
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Subject: Tin electroplate finish for PCBs
Author: [log in to unmask] at ccmgw1
Date: 4/17/96 8:42 PM
I want to evaluate the possibility of converting to a 100% tin electroplate
finish on PCBs that requires a tin or tin-lead for contact pads. Primarily
72 pin SIMM memory modules which are destined for use in tin or tin-lead
(usually high tin content 90/10 - 95/5 tin-lead alloy).
Overall thickness is an issue with SIMM products (.050" + .004" -.003"). The
HAL process results in a adequate finish most of the time, however this process
can not be tightly controlled and is a root cause for thickness rejects and
contact rel problems.
I've a couple of goals:
1) Improve quality and performance of our product by improving contact
reliability.
2) Give our PCB suppliers a way to improve yields for overall thickness.
There are other pluses (for us and the PCB suppliers) associated with a
conversion to tin that I won't bring up. I'm primarily concerned with
overcoming any potential quality or reliability problems. Here are some
of my concerns:
1) Tin whisker growth. Dependent on stress induced during electroplating.
Low/no stress plating is critical. Whisker growth begins at ~50 'C.
Spacing between contact pads on a 72 pin SIMM is .010" so whisker growth
has to be eliminated. Whiskering is not a problem with lead present.
Test conditions: High temperature storage, 150 'C unbiased. Length ?
1080 hrs 125 'C high temp operating life, biased.
85/85 APB T&H
2) Tin undercut must be minimized to prevent tin slivers.
3) Solderability, tin-oxides form readily at room temperature. This problem
exists with HAL, but to a lesser same extent.
4) Copper-tin intermetallic growth, tin should be a minimum of 200 microinches
thick. Again, this problem exists with HAL.
Test conditions: Same as in #1.
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My question is, has anyone experience with a tin electroplate finish in a
similar application? Any potential problems I've overlooked?
All comments are appreciated. Thanks in advance.
Tracy Tennant ([log in to unmask])
ph (208) 368-5963
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