Thanks for reply. Especially to Steve and Bruce. The sum of your experience in the game is such that I will screw down the EFO matter a little and concentrate on cratering and thermocompression trials. If you calculate (I havn't done) the energy of a millisecond induced voltage 15mms far from the source (the EFO), induced in proportion to the length of the receipient (the "coil"), I guess the energy will be so few picowatts, that a PN-junction will not die even if there is a primary breakdown. Some people think that too high a reversed junction will always be killed, but it's also a question of energy, not only voltage. The more I think about it the more I doubt about EFO chip-murderers.

A risk: I may come back to you if the chip killing goes on. Few chips die, but they are extremly expensive. Repare is also an additional cost, so we want an explanation soon.

Ingemar

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