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Subject:	Reliability test data on SLC type technology
From:	[log in to unmask]
Date:	Thu, 15 Aug 96 13:57:19 EDT
Content-Type:	text/plain
Parts/Attachments:	text/plain (22 lines)

*** Reply to note of 08/15/96 11:22
FROM: I. MEMIS, DEPT GGMG/BLDG 257-4, AISLE A, ENDICOTT
      ENDICOTT ELECTRONIC PACKAGING
SUBJECT: Reliability test data on SLC type technology
There is a new technical report on SLC in the IPC Proceedings of March
1996.  It includes SLC reliability data.  If you want more than that,
contact me directly at 607-755-6022 or thru e-mail([log in to unmask]).
Irv Memis
IBM Microelectronics
Endicott, NY

USERID: MEMISIRV, NODEID: ENDVM5, TEL: 855-6022  FAX: 857-1126

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