TECHNET Archives

May 1998

TechNet@IPC.ORG

Options: Use Monospaced Font
Show Text Part by Default
Show All Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Subject:
From:
"<Jason M. Smith>" <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Fri, 15 May 1998 06:25:42 -0400
Content-Type:
text/plain
Parts/Attachments:
text/plain (26 lines)
As industry is moving to more hard fact quality  measures and
standardizational measures, does anyone have any ideas as to what to
implement into a process control system on wave soldering?  I currently
have visual with the glass plate and reliability covered with the wave
optimizer and SPC for control limits, etc.  What else is out there in the
arena of process control for wave soldering.  I also do ionic testing,
solder samples, and ion chromatography tests.  What have I missed that is
critical?

Jason Smith
Process Materials Engineer
Lexmark Electronics
(606) 232-7667

################################################################
TechNet E-Mail Forum provided as a free service by IPC using LISTSERV 1.8c
################################################################
To subscribe/unsubscribe, send a message to [log in to unmask] with following text in the body:
To subscribe:   SUBSCRIBE TechNet <your full name>
To unsubscribe:   SIGNOFF TechNet 
################################################################
Please visit IPC web site (http://jefry.ipc.org/forum.htm) for additional information.
For the technical support contact Dmitriy Sklyar at [log in to unmask] or 847-509-9700 ext.311
################################################################


ATOM RSS1 RSS2