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Reply To: | TechNet E-Mail Forum. |
Date: | Wed, 15 Jul 1998 13:47:39 EDT |
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Abdulla
In response to the following questions you asked
1- Should process indicators be placed into the same control chart as
defects or should they be placed into a separate control chart.
ANSWER: PROCESS INDICATORS SHOULD BE CHARTED ON AN X-BAR/ R-CHART AND DEFECTS
SHOULD BE CHARTED SEPARATELY ON A "P", OR "NP" CHART
2- Should process indicators be included in capability studies, should
they be in the same capability study as the defects or should there be a
separate capability study for process indicators.
ANSWER: PROCESS CAPABILITY STUDIES ARE MOST EFFECTIVE WHEN USING PROCESS
PARAMETERS FOR THE STUDY. I WOULD USE DEFECT ANALYSIS AS A CHECK ON THE
ACTIONS TAKEN AS A RESULT OF THE CAPABILITY STUDY OF PROCESS PARAMETERS.
Ed Cosper from GEI has an excellent manual that he uses in his SPC classes. He
may be able to provide one to you.
Dick Desrosiers
AOI International
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