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October 1999

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Subject:
Test Flow of DRAM test
From:
Lucas Liu <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Fri, 15 Oct 1999 21:59:01 +0800
Content-Type:
text/plain
Parts/Attachments:
text/plain (24 lines) 
Hi ,

The company where I am working is thinking of setting up a plant to test
for DRAM and memory devices after burn-in. Can anybody provide me with
some  knowledge of the kind of test handlers or equipment and
testflow of constructing such a facility ?

Rgds,
Lucas

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