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September 2015

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Subject:
From:
Joyce Koo <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, [log in to unmask]
Date:
Wed, 23 Sep 2015 16:29:53 -0400
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using glancing angle light incidence (position your light almost parallel
to your PWB surface), particulate, finger prints, contamination (if it is
organic), usually stands out... you need to establish what is acceptable
for your application and what kind of the contamination...  my 1.4 cents.
       jk
> I’ll report later this week about Clumpy and Kloumpios assistance, but
> we’ve got a question about the interpretation of magnification to be
> used for inspection of cleanliness.
>
> Both J-STD-001 and IPC-A-610 state if the presence of a defect cannot be
> determined at the inspection power, the item is acceptable.  For
> inspecting of cleanliness, magnification is not required but then a
> reference to a note indicates magnification may be required fine pitch
> parts are present.  Magnification may be needed to determine whether
> magnification affects form, fit or function.
>
> If residues are not visible without magnification, but are visible under
> magnification, but do not affect form fit or function, are the residues
> defects?
>
> Dick Krug, CSSBB, CSMTPE
> Lead Process Engineer
> Sparton Brooksville, LLC
> 30167 Power Line Road
> Brooksville, FL  34602-8299
> (352) 540-4012
> [log in to unmask]
>
>
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