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July 1998

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Subject:
From:
KRIMLYA AT AEC <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Wed, 15 Jul 1998 16:19:23 +0300
Content-Type:
text/plain
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Dear Tech Net:

We are an electronics company located in the middle east and a member of
IPC, we are implementing SPC and are having problems with Process
Indicators, our questions are:

   1- Should process indicators be placed into the same control chart as
defects or should they be placed into a separate control chart.
   2- Should process indicators be included in capability studies, should
they be in the same capability study as the defects or should there be a
separate capability study for process indicators.


Best Regards

Abdullah Al Krimly
Industrial Engineer
AEC SPC coordinator
Advanced Electronic co. Ltd.
P.O Box 11623
K.S.A.
e_mail: [log in to unmask]

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