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November 2005

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Subject:
From:
Vladimir Igoshev <[log in to unmask]>
Reply To:
(Leadfree Electronics Assembly Forum)
Date:
Wed, 16 Nov 2005 13:27:37 -0500
Content-Type:
text/plain
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text/plain (91 lines)
Hello Jean-Paul,

I do remember the day we met (it wasn't the best one for me, though :-)).
Unfortunately, I haven't had a chance to continue my work (just trying to do it now). I also look forward to seeing any kinetic and microstructural data on new alloys (I eager to see the paper you referred to in your previous e-mail). 

Regards,

Vladimir

Vladimir Igoshev, Ph. D.
Senior Materials Researcher
Research in Motion
451 Phillip St.
Waterloo, ON, N2L 3X2

Voice: (+1) 519-888-7465, ext. 5283
Fax: (+1) 519-886-0863
E-mail: [log in to unmask]


-----Original Message-----
From: Leadfree [mailto:[log in to unmask]]On Behalf Of [log in to unmask]
Sent: Wednesday, November 16, 2005 1:15 PM
To: [log in to unmask]
Subject: Re: [LF] Reliability prediction of LF soldering


Hello Vladimir,
I have read your work on creep of SAC solders in the Journal of Electronic
Materials, and found it very interesting, especially with respect to the effect
 of Ag contents on rupture time.

We met in Toronto a few years ago, when you advocated a micro-mechanism
based approach for lead-free solder joint life predictions.  I am all  for it, and
I am interested in all possible approaches that can help us predict  solder
joint life in real board assemblies.

I am curiious about how your  model is coming along and how  your predictions
compare to thermal cycling results.  Do you  have publications / reports you
can refer us to?

Thanks,
Jean-Paul

In a message dated 11/16/2005 12:20:47 PM Eastern Standard Time,
[log in to unmask] writes:

I knew  you wouldn't agree :-).I also knew, you can do it for Pb-Sn solders.
However,  your predictions will not be based on the microscopic model, but
rather on  analytical ones, which were sort of "adjusted" to the collected data
(from lab  experiments and from the field).






Quote of the month:
"I often say that when you can  measure what you are speaking about, and
express it in numbers, you know  something about it; but when you cannot measure
it, when you cannot express it  in numbers, your knowledge is of a meagre and
unsatisfactory kind" Lord  Kelvin
_______________________________________________
Jean-Paul  Clech

EPSI Inc., P.O. Box 1522, Montclair, NJ 07042, USA
tel.:+1  (973)746-3796, fax: +1 (973)655-0815

_http://www.jpclech.com_ (http://www.jpclech.com/)

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