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September 2005

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Subject:
From:
Davis Yang <[log in to unmask]>
Reply To:
(Leadfree Electronics Assembly Forum)
Date:
Mon, 5 Sep 2005 11:22:41 +0800
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I wish the workshop can discuss the test issue of electronic components. I'm trying to develop a guideline for test electronic components like resister, capacitor, IC, crystal, connecter, PCB etc.  I am finding it is very headache for me to make a decision which level is proper to disassemble the components into "homogeneous material".  From the industry viewpoint, I have to take account of test cost.  for example,  It's impractical to disassemble the 0402 or 0201 chip components into "homogeneous material" like coating, internal terminal and ceramic part etc. same issue for IC. How to disassemble CSP or LLP device into "homogeneous material" ? There are a lot of "homogeneous material" in the device according to EU's definition of homogeneous material. Same issue with PCB.  My question is: How to take the homogeneous material sample from these electronic components for test lab to conduct RoHS compliant test? Do these components have to be disassembled into homogeneous material strictly per EU's definition, or these small components can be  taken as just one(whole component) or two (solder bump and body)homogeneous material? We have to balance between the ideal  test method and economic test method(industry cost). What's the proper (accepted by both industry and RoHS regulation) homogeneous material sampling method for electronic parts ?

Wish to settle down the issue ASAP.

Regards!

Davis



----- Original Message ----- 

From: "John R. Sieber" <[log in to unmask]>

To: <[log in to unmask]>

Sent: Thursday, September 01, 2005 11:29 PM

Subject: [LF] Test Methods, Reference Materials, and Declarations





> Hello Leadfree members,

> 

> My name is John Sieber and I am an analytical chemist at the National

> Institute of Standards and Technology in Gaithersburg, MD.  By training, I

> am a specialist in X-ray fluorescence spectrometry.  My normal

> responsibilities include development of Standard Reference Materials and

> XRF test methods.  I am a member of ASTM International Committee F40 on

> Declarable Substances in Materials and of IEC TC111 Working Group 3 for

> test methods for electrotechnical products.  As you may already know, TC111

> WG3 is working on a set of test methods for restricted substances in RoHS

> while ASTM F40 has recently organized for the same purpose.

> 

> Currently, my primary job is to lead a committee charged with organizing a

> workshop at NIST to address RoHS declarations and testing issues.  You can

> read about our upcoming workshop at

> http://www.nist.gov/public_affairs/confpage/051005.htm with detailed info

> at two linked

> pages:  http://www.cstl.nist.gov/nist839/RoHS/RoHS_Meeting.htm for the

> workshop homepage and

> www.cstl.nist.gov/nist839/RoHS/Preliminary%20Program%20Info.pdf for a copy

> of the preliminary program.

> 

> In a nutshell, the workshop has several goals.  Our mission is to support

> U.S. industry with the technology to meet challenges like RoHS and help

> maintain competitiveness in the global economy.  We need to learn about the

> impact of RoHS and related regulations so we can identify and prioritize

> SRM development projects, test method research, material declarations and

> database issues, and education/outreach opportunities.  We are creating a

> workshop program to bring together experts and seekers of knowledge to

> discuss these issues.  Materials science research is also a priority at

> NIST, but is not a primary element of the workshop agenda.  However,

> experts from across NIST will be available to meet with attendees.

> 

> We see this workshop as an important step in a continuing effort to be more

> proactive and responsive in the face of environmental, health, and

> manufacturing regulations arising around the world.  We need people from

> all parts of the supply chain to join us in Gaithersburg to help.

> 

> If you have questions, I will gladly discuss them in this listserv forum or

> privately.

> 

> John

> 

> 

> John R. Sieber, PhD

> Scientific Advisor

> 

> Chemical Science and Technology Laboratory

> National Institute of Standards and Technology

> 100 Bureau Drive, Stop 8391

> Gaithersburg, MD  20899-8391 USA

> 

> [log in to unmask]

> Tel:  1.301.975.3920

> Fax:  1.301.975.3845

> www.cstl.nist.gov/

> 

> Identification of commercial items in this document does

> not imply endorsement by NIST or that items are

> 

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