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January 2006

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Subject:
From:
"Abbott, Don" <[log in to unmask]>
Reply To:
(Leadfree Electronics Assembly Forum)
Date:
Fri, 27 Jan 2006 15:25:12 -0500
Content-Type:
text/plain
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text/plain (188 lines)
Lee,
This bring up an interesting point - if the Pb is only on the surface,
as it is plated, then would it be considered "homogeneous" (as it can be
mechanically removed by scraping) - in which case is would be 100% Pb
and thus a clear violation?

XRF may be preferable to sectioning, in light of the above.

Regards,
Don Abbott
TI
508-236-1569

-----Original Message-----
From: Leadfree [mailto:[log in to unmask]] On Behalf Of Lee parker
Sent: Friday, January 27, 2006 3:17 PM
To: [log in to unmask]
Subject: Re: [LF]

Carol

I agree with George. XRF is only suitable for measuring the thickness of
an identified metal. It does not tell you where in the composite the
metal is located. An approach you may want to pursue is to make cross
sections of the problem area (probably a pad) and then use a SEM with
EDAX capability. Place the cross section into the SEM and then focus the
EDAX beam at several points on the cross section starting at the surface
and working down. You will then have an elemental analysis at several
points and you can then determine what metals are on the surface, the
transition region and the base material. If you do not have this
capability on site, there are many labs across the country that do.

Good luck

Lee

J. Lee Parker, Ph.D.
JLP Consultants LLC
804 779 3389

----- Original Message ----- 
  From: Wenger, George M.<mailto:[log in to unmask]> 
  To: [log in to unmask]<mailto:[log in to unmask]> 
  Sent: Friday, January 27, 2006 1:36 PM
  Subject: Re: [LF]


  Carol,

  What are the units for the 0.14-0.19?  Are they percent of XRF signal
or
  are they XRF thickness measurements?  How does the XRF analysis tell
you
  the Pb is on top?  Do you have an XRF spectrum you can send or post on
  Steve's web page? 


  Regards,
  George
  George M. Wenger
  Reliability / FMA Engineer
  Base Station and Subsystems Group
  Andrew Corporation, 40 Technology Drive, Warren, NJ 07059 (908)
546-4531
  [log in to unmask]<mailto:[log in to unmask]>

  -----Original Message-----
  From: Leadfree [mailto:[log in to unmask]] On Behalf Of Carol Spiers
  Sent: Friday, January 27, 2006 1:20 PM
  To: [log in to unmask]<mailto:[log in to unmask]>
  Subject: [LF]

  I have just had an analysis completed on a first batch run of leadfree
  boards.  Results indicate we have  uniform contamination of 0.14-0.19
  layer of lead across the board.  The testing and measurements were
  obtained using  xray flouresence and indicate the lead is on the top
  layer of the melded solder.  We confirmed that all parts were
documented
  as being Lead Free (but not tested by us for compliance).  Boards were
  double sided silver immersion smt and thru hole combinations.  Solder
  paste used was SAC, wave solder bar used was SAC.  The wave solder
  machine is brand new (never used in a leaded process).  SMT oven is
used
  for both leaded and unleaded processes. 
  Because the contamination appears to be uniformly spread across the
  board I tend to think this isn't a problem related to a couple of
  components not actually being lead free and contiminating the huge pot
  of solder in the wave.  One suggestion was that there might have been
a
  thin layer of lead over top of the silver immersion on the bare
boards.
    
  Is there anyone out there that would care to offer some suggestions as
  to where we should focus our investigation or if any alternative
testing
  should be used. 
  So far we are going to:
  1) do comparison testing of two batches of bare boards of the same
  product coming from different suppliers and undergoing identical
  processing.  
  2) have a sample of the wave solder evaluated for contaminates and to
  establish the bench for future sample evaluations. 

  Once again, your input and help will be much appreciated. 

  Carol
  C. M. Spiers
  Director of Operations
  Interalia Inc. 


 
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